Magnetic stray fields of Co-Cr microstrips measured by Lorentz microscopy
نویسندگان
چکیده
Magnetic stray fields of Co-Cr microstrips are investigated for bit stabilization in a vertical Bloch line memory (VBLM). The stray fields were revealed using Lorentz force based Foucault and differential phase contrast (DPC) techniques in a transmission electron microscope. The assumed shape of the stray fields for VBLM use has been experimentally verified. Agreement between experiment and simulation is obtained.
منابع مشابه
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